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IEC 60884-1 Clause 10.1 Anti - Shock Probe Experiment Device

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IEC 60884-1 Clause 10.1 Anti - Shock Probe Experiment Device

Name: IEC 608841 Clause 101 Anti Shock Probe Experiment Device
Brand: Sinuo
Price: 1 USD

IEC 60884-1 Clause 10.1 Anti - Shock Probe Experiment Device Manufactures

Brand Name : Sinuo

Model Number : SN2210-19

Certification : Calibration Certificate (Cost Additional)

Place of Origin : China

MOQ : 1

Price : Negotiable

Payment Terms : L/C, T/T

Supply Ability : 60 Sets Per Month

Delivery Time : 15 Days

Packaging Details : Standard Exporting Boxed

Applied standard : IEC 60884-1

Applied clause : 10.1

Working voltage : AC 220V±10%, 50HZ±1%

Working temperature : 0-40

Relative humidity : ≤80%

Electrode output the testing voltage : AC40-50V

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IEC 60884-1 Clause 10.1 Anti-Shock Probe Experiment Device

Product Information:

This equipment meets the requirements of IEC 60884-1: 2013 Clause 10.1, IEC 60669-1: 2017 Clause 10.1, and etc.

It is used with the testing probe for the convenience and correctness. In the two output electrodes, the low potential (the red one) is connected with the energized part of the electrical appliance and the high potential is connected with the input terminal of the probe used. At this time, conduct the circuit and push the button of start. Then use the probe to touch the parts that maybe electrified. If the alarm of the equipment sounds, it is proved that the testing part is electrified. Then push the button of reset and cut down the circuit.

Technical Parameters:

Applied standard	IEC 60884-1
Applied clause	10.1
Working voltage	AC 220V±10%, 50HZ±1%
Electrode output the testing voltage	AC40-50V
Working temperature	0-40
Relative humidity:	≤80%
Environment	No shaking and no corrosive gas

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IEC 60884-1 Clause 10.1 Anti - Shock Probe Experiment Device Images

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IEC 60884-1 Clause 10.1 Anti - Shock Probe Experiment Device

IEC 60884-1 Clause 10.1 Anti - Shock Probe Experiment Device

Anti - Shock Probe Experiment Device

Clause 10.1 Probe Experiment Device

IEC 60884-1 Probe Experiment Device

IEC 60884-1 Clause 10.1 Anti - Shock Probe Experiment Device Images